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Signet Si-PinXRF Testing

Signet Si-Pin — Advanced XRF Analyzer

Si-Pin USA detector. ppm-to-99.99% range. Closed-beam optical path.

The Signet Si-Pin combines a USA-sourced SIPIN detector with W-target X-ray emission and 90° direct-angle closed-beam optics for the cleanest, most consistent spectra in its class.

Build

Industrial

  • SIPIN USA detector
  • 165 ± 5 eV resolution
  • W-target X-ray tube
  • 300×300×100 mm chamber
  • 5–60 s test time
Overview

Engineering that replaces a team.

300 × 300 × 100 mm sample chamber, HD camera, selectable filters, 2 mm optimum collimator (1 mm optional), and Semsons qualitative & quantitative analysis software.

  • 90° direct-angle closed beam
  • 0–50 kV / 0–1 mA
  • HD camera
  • Selectable customized filters
  • Digital multichannel analyzer
Technical Specifications

Every detail on the record.

Sourced from the official 2026 Semsons Tech XRF Testing catalogue.

DetectorSIPIN (USA)
Resolution165 ± 5 eV
X-ray SourceW-target tube, Be-window, air-cooled
Optical System90° direct-angle closed beam
CollimatorOptimum 2 mm (optional 1 mm)
Chamber300 × 300 × 100 mm
Test Time5 – 60 s (user selectable)
ElementsNa (11) to U (92) except light elements
Dimensions400 × 350 × 300 mm
Weight25 kg
Applications

Built for the workflows that demand precision.

01

Refineries

02

BIS hallmarking centers

03

Research labs

04

Customs

Answers

Buyer questions, answered.

Clear answers to the most common technical and commercial questions on this machine.

Si-Pin uses a USA SIPIN detector with finer 165 eV resolution and a 90° closed-beam optical path — ideal for refineries doing trace-element analysis. FSDD covers 72 elements with the legendary triple-stage W-target tube optimised for jewellery and hallmarking.
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